首页> 外国专利> METHOD FOR PROTECTION OF ANGLES OF 3D MICROMECHANICAL STRUCTURES ON SILICON PLATE DURING DEEP ANISOTROPIC ETCHING

METHOD FOR PROTECTION OF ANGLES OF 3D MICROMECHANICAL STRUCTURES ON SILICON PLATE DURING DEEP ANISOTROPIC ETCHING

机译:深各向异性刻蚀过程中硅板上3D微机械结构角度保护的方法

摘要

FIELD: manufacturing technology.;SUBSTANCE: this invention consists in fact that protection of angles of 3D micro mechanical structures on silicon plate with crystallographic orientation (100) at deep anisotropic etching in water solution of potassium hydroxide KOH involves formation of mask pattern with angles protection elements adjacent to initial part of topological mask near point of intersection of sides of protected chip or three-dimensional microstructure on plate and continued beyond initial part of mask, wherein for protection of convex angles chip or three-dimensional microstructure of mask pattern with T-shaped elements containing lengthwise and crosswise part, wherein etching is carried out until silicon elements formed in area of mask protection angles are not etched away during anisotropic chemical etching to boundary of initial topological area of rigid centre micro-mechanical structures, longitudinal parts of two adjacent T-shaped elements protection are perpendicular to each other. At that, sizes of produced 3D micro-mechanical structures are determined from certain conditions.;EFFECT: possibility of widening range of 3D micro-mechanical structures or chips, improved linearity of converter characteristics and increasing loading capacity of primary converters.;1 cl, 4 dwg, 1 tbl
机译:领域:制造技术;发明内容:实际上,本发明在于在氢氧化钾KOH水溶液中进行深各向异性蚀刻时,保护具有晶体学取向(100)的硅板上的3D微机械结构的角度涉及形成具有角度保护的掩模图案与拓扑掩膜的初始部分相邻的元素,靠近受保护芯片的侧面或板上的三维微结构的交点,并延续到掩膜的初始部分之外,其中,为了保护凸角芯片或掩膜图案的三维微结构,采用T-包含纵向和横向部分的成形元件,其中进行刻蚀直到在各向异性化学刻蚀期间将刻蚀保护角区域内形成的硅元素刻蚀到刚性中心微机械结构的初始拓扑区域(两个相邻的纵向部分)的边界为止T形元件的保护是垂直的对彼此。那时,所生产的3D微机械结构的尺寸由某些条件确定。效果:可能会扩大3D微机械结构或芯片的范围,改善转换器特性的线性度并增加一次转换器的负载能力。; 1 cl, 4桶,1桶

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