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Dislocation density reduction method of the production method and iii nitride substrate Iii Nitride Substrate

机译:降低位错密度的方法及氮化物基板的制造方法III氮化物基板

摘要

PROBLEM TO BE SOLVED: To provide a method for obtaining easily and surely a group III nitride substrate having a low dislocation density.;SOLUTION: A production method of a group III nitride substrate includes: an annealing step for forming irregularities on the surface 1a of a ground substrate, by annealing the ground substrate 1 whose surface is flat under a high-temperature reduction atmosphere (for example, an atmosphere containing hydrogen gas at 900°C-1,150°C as a main component); and a formation step for forming a group III nitride layer 2, for example, by a flux method on the ground substrate 1 after the annealing step.;COPYRIGHT: (C)2015,JPO&INPIT
机译:解决的问题:提供一种容易且可靠地获得具有低位错密度的III族氮化物衬底的方法。解决方案:III族氮化物衬底的制造方法包括:退火步骤,用于在硅衬底的表面1a上形成凹凸。通过在高温还原气氛(例如,以900℃〜1,150℃的氢气为主要成分的氢气的气氛)下使表面平坦的接地基板1退火而形成的接地基板。退火步骤之后,在接地基板1上例如通过熔剂法形成III族氮化物层2的形成步骤。版权所有:(C)2015,JPO&INPIT

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