首页> 外国专利> Screen, display device, particle, optical sheet, particle inspection apparatus, particle inspection method, particle manufacturing apparatus, particle manufacturing method, screen manufacturing method, and screen inspection method

Screen, display device, particle, optical sheet, particle inspection apparatus, particle inspection method, particle manufacturing apparatus, particle manufacturing method, screen manufacturing method, and screen inspection method

机译:屏幕,显示装置,颗粒,光学片,颗粒检查设备,颗粒检查方法,颗粒制造设备,颗粒制造方法,屏幕制造方法和屏幕检查方法

摘要

To provide a particle, an optical sheet, a screen, a display device, a particle inspection device, and a particle inspection device capable of reducing speckle and capable of effectively avoiding degradation of image quality accompanying color change A particle manufacturing method, a particle inspection method, a screen inspection method, and a screen manufacturing method.SOLUTION: The particles include a first portion 61 and a second portion 62 having different relative permittivities, and the first portion 61 and the second portion 62 are formed of a reflectance or a reflectance spectrum of a wavelength of invisible light, The transmittance or transmittance spectrum of the wavelength of the invisible light is different.(FIG.
机译:为了提供一种颗粒,光学片,屏幕,显示装置,颗粒检查装置和颗粒检查装置,其能够减少斑点并能够有效地避免伴随变色的图像质量的降低。颗粒的制造方法,颗粒检查解决方案:颗粒包括具有相对介电常数不同的第一部分61和第二部分62,并且第一部分61和第二部分62由反射率或反射率形成。不可见光的波长的光谱,或不可见光的波长的透射光谱或透射光谱不同。

著录项

  • 公开/公告号JPWO2017061586A1

    专利类型

  • 公开/公告日2017-11-02

    原文格式PDF

  • 申请/专利权人 大日本印刷株式会社;

    申请/专利号JP20170530242

  • 申请日2016-10-07

  • 分类号G03B21/60;G03B21/62;G03B21/14;G02B27/48;C09K11/06;C09K11/08;

  • 国家 JP

  • 入库时间 2022-08-21 13:54:30

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号