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Group III element nitride crystal manufacturing method, group III element nitride crystal, semiconductor device, semiconductor device manufacturing method, and group III element nitride crystal manufacturing apparatus

机译:III族元素氮化物晶体的制造方法,III族元素氮化物晶体,半导体装置,半导体装置的制造方法以及III族元素氮化物晶体的制造装置

摘要

Provided is a production method for growing a group III element nitride crystal using a surface on the -c plane side as a crystal growth surface. The present invention is a method for producing a group III element nitride crystal, which includes a vapor phase growth step in which a group III element nitride crystal 12 is grown on the crystal growth surface of a group III element nitride seed crystal 11 by a vapor phase growth method. The vapor phase growth step is a step of growing a group III element nitride crystal 12 by reacting a group III element metal, an oxidizing agent, and a nitrogen-containing gas, or group III element oxidation. A reduced gas generation step of generating a reduced gas of the group III element oxide by reacting an oxide and a reducing gas; and a reaction of the reduced gas and a nitrogen-containing gas to generate a group III element nitride A step of generating a crystal 12, wherein the crystal growth surface is a surface on the −c plane side, the crystal growth temperature is 1200 ° C. or higher, and in the vapor phase growth step, Growing group III element nitride crystals in approximately -c direction And features.
机译:提供一种使用-c平面侧的表面作为晶体生长表面来生长III族元素氮化物晶体的制造方法。本发明是用于制造III族元素氮化物晶体的方法,其包括气相生长步骤,其中通过蒸汽在III族元素氮化物籽晶11的晶体生长表面上生长III族元素氮化物晶体12。相生长法。气相生长步骤是通过使III族元素金属,氧化剂和含氮气体反应或III族元素氧化来生长III族元素氮化物晶体12的步骤。还原气体生成步骤,其通过使氧化物与还原气体反应而生成III族元素氧化物的还原气体。还原气体和含氮气体的反应,生成III族元素氮化物。生成晶体12的步骤,其中晶体生长表面是-c平面侧的表面,晶体生长温度为1200°在气相生长步骤中,在大约-c方向上生长III族元素氮化物晶体。

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