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Scattered light information processing method, scattered light information processing apparatus and scattered light information processing system

机译:散射光信息处理方法,散射光信息处理装置和散射光信息处理系统

摘要

DUT is an optical element 300 of the permeability, and scattered light measurement information acquisition step of acquiring information of the scattered light intensity distribution of irradiated light at a predetermined angle, the shape and optical properties of the object to be measured the measurement conditions of the scattered light intensity distribution, the model generation step of generating a measured object model (step S202), with respect to the measurement object model, the function representing the scattered light information on the exit side that transmits at least the measurement object function parameter setting step of setting the parameters (step S203), the scattered light intensity distribution calculating step of calculating the scattered light intensity distribution calculation result based on the measurement object model obtained in the scattered light measurement information acquisition step scattered light intensity and distribution of information, the function parameter calculating step of calculating the function parameters to the scattered light intensity distribution calculation result calculated based on the measurement object model, coincides (scan Having from-up S204 and step S207), the.
机译:DUT是具有导磁率的光学元件300,并且散射光测量信息获取步骤以预定角度获取照射光的散射光强度分布,预定角度,被测物体的形状和光学特性的信息。散射光强度分布,用于生成测量对象模型的模型生成步骤(步骤S202),相对于测量对象模型,该函数表示至少发送测量对象功能参数设置步骤的出射侧的散射光信息。设定参数(步骤S203),根据在散射光测量信息获取步骤中获得的测量对象模型计算散射光强度分布计算结果的散射光强度分布计算步骤,散射光强度和信息分布,功能在根据测量对象模型计算出的散射光强度分布计算结果中计算功能参数的参数计算步骤一致(扫描从S204到步骤S207)。

著录项

  • 公开/公告号JPWO2015093115A1

    专利类型

  • 公开/公告日2017-03-16

    原文格式PDF

  • 申请/专利权人 オリンパス株式会社;

    申请/专利号JP20150553403

  • 发明设计人 小林 宏史;

    申请日2014-09-18

  • 分类号G01M11/00;G01N21/47;

  • 国家 JP

  • 入库时间 2022-08-21 13:53:49

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