首页> 外国专利> MULTI CHARGED PARTICLE BEAM BLANKING APPARATUS, MULTI CHARGED PARTICLE BEAM BLANKING METHOD, AND MULTI CHARGED PARTICLE BEAM WRITING APPARATUS

MULTI CHARGED PARTICLE BEAM BLANKING APPARATUS, MULTI CHARGED PARTICLE BEAM BLANKING METHOD, AND MULTI CHARGED PARTICLE BEAM WRITING APPARATUS

机译:多重带电粒子束消隐装置,多重带电粒子束消隐方法和多重带电粒子束书写装置

摘要

A multi charged particle beam blanking apparatus includes a substrate, where a plurality of passage holes are formed, to let multi-beams of charged particle beams individually pass through a passage hole concerned; a plurality of reference electrodes, each arranged close to a corresponding passage hole, to be applied with a reference potential, not a ground potential, not via a transistor circuit, in an irradiation region of the whole multi-beams; and a plurality of switching electrodes, arranged at the substrate such that each of the plurality of switching electrodes and a corresponding paired one of the plurality of reference electrodes are opposite each other across a corresponding passage hole, to be applied with the reference potential and a control potential different from the reference potential in a switchable manner.
机译:一种多电荷粒子束消隐装置,包括:基板,其上形成有多个通孔,以使多束带电粒子束分别通过所涉及的通孔;多个参比电极,每个参比电极布置在相应的通孔附近,在整个多光束的照射区域中,不经由晶体管电路而被施加参比电位,而不是接地电位。多个开关电极设置在基板上,以使得多个开关电极中的每一个与多个参考电极中的对应配对的一个在相对应的通孔上彼此相对,以被施加参考电位和控制电位与参考电位的可切换方式不同。

著录项

  • 公开/公告号US2017271118A1

    专利类型

  • 公开/公告日2017-09-21

    原文格式PDF

  • 申请/专利权人 NUFLARE TECHNOLOGY INC.;

    申请/专利号US201715448242

  • 发明设计人 HIROSHI MATSUMOTO;

    申请日2017-03-02

  • 分类号H01J37/04;H01J37/24;H01J37/063;H01J37/317;

  • 国家 US

  • 入库时间 2022-08-21 13:52:18

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