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Indium Tin Oxide Thin Films With Both Near-Infrared Transparency and Excellent Resistivity
Indium Tin Oxide Thin Films With Both Near-Infrared Transparency and Excellent Resistivity
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机译:具有近红外透明性和出色电阻率的氧化铟锡薄膜
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摘要
An indium tin oxide film containing by weight about 90% In2O3 and about 10% SnO2 is prepared using a low-energy deposition sputter process on a substrate. The indium tin oxide film thus obtained has a carrier concentration on the order of 1020/cm3 and a carrier mobility greater than 30 cm2/Vs. The low carrier concentration results in an increased transmission in the near infra-red region, while the high carrier mobility results in good conductive properties.
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机译:使用低能量沉积制备包含约90%In 2 Sub> O 3 Sub>和约10%SnO 2 Sub>的铟锡氧化物薄膜在基板上进行溅射工艺。这样获得的铟锡氧化物膜的载流子浓度约为10 20 Sup> / cm 3 Sup>,载流子迁移率大于30cm 2 Sup> / Vs。低载流子浓度导致在近红外区域的透射率增加,而高载流子迁移率导致良好的导电性能。
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