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NONDESTRUCTIVE OPTICAL DETECTION OF TRACE UNDERCUT, WIDTH AND THICKNESS

机译:痕量不足,宽度和厚度的非破坏性光学检测

摘要

Some example forms relate to a method of nondestructively measuring a geometry of an electrical component on a substrate. The method includes directing light at the electrical component. The light is at an original intensity. The method further includes measuring light that is reflected off of the electrical component. The reflected light includes undiffracted light and diffracted light. The diffracted light is at a diffracted intensity. The method further includes determining a ratio of diffracted intensity to original intensity and utilizing the ratio to determine a geometry of the electrical component.
机译:一些示例形式涉及一种非破坏性地测量基板上的电子部件的几何形状的方法。该方法包括将光引导至电气部件。光处于原始强度。该方法还包括测量从电气部件反射回来的光。反射光包括未衍射光和衍射光。衍射光处于衍射强度。该方法还包括确定衍射强度与原始强度的比率,并利用该比率来确定电子部件的几何形状。

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