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Method of manufacturing an integrated circuit having field effect transistors including a peak in a body dopant concentration

机译:制造具有场效应晶体管的集成电路的方法,该场效应晶体管包括体掺杂剂浓度的峰值

摘要

An integrated circuit having field effect transistors and manufacturing method. One embodiment provides an integrated circuit including a first FET and a second FET. At least one of source, drain, gate of the first FET is electrically connected to the corresponding one of source, drain, gate of the second FET. At least one further of source, drain, gate of the first FET and the corresponding one further of source, drain, gate of the second FET are connected to a circuit element, respectively. A dopant concentration of a body along a channel of each of the first and second FETs has a peak at a peak location within the channel.
机译:具有场效应晶体管的集成电路及其制造方法。一个实施例提供了一种包括第一FET和第二FET的集成电路。第一FET的源极,漏极,栅极中的至少一个电连接至第二FET的源极,漏极,栅极中的相应一个。第一FET的源极,漏极,栅极中的至少另一个和第二FET的源极,漏极,栅极中的相应的另一个分别连接至电路元件。沿着第一和第二FET中的每一个的沟道的主体的掺杂剂浓度在沟道内的峰值位置处具有峰值。

著录项

  • 公开/公告号US9761665B2

    专利类型

  • 公开/公告日2017-09-12

    原文格式PDF

  • 申请/专利权人 INFINEON TECHNOLOGIES AG;

    申请/专利号US201615157448

  • 申请日2016-05-18

  • 分类号H01L27/148;H01L29/768;H01L29/10;H01L21/265;H01L21/266;H01L21/8238;H01L27/088;H01L29/66;H01L29/78;H01L21/8234;H01L29/423;

  • 国家 US

  • 入库时间 2022-08-21 13:48:20

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