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Single-chip field effect transistor (FET) switch with silicon germanium (SiGe) power amplifier and methods of forming

机译:具有硅锗(SiGe)功率放大器的单芯片场效应晶体管(FET)开关及其形成方法

摘要

Various embodiments include field effect transistors (FETs) and methods of forming such FETs. One method includes: forming a first set of openings in a precursor structure having: a silicon substrate having a crystal direction, the silicon substrate substantially abutted by a first oxide; a silicon germanium (SiGe) layer overlying the silicon substrate; a silicon layer overlying the SiGe layer; a second oxide overlying the silicon layer; and a sacrificial layer overlying the second oxide, wherein the first set of openings each expose the silicon substrate; undercut etching the silicon substrate in a direction perpendicular to the crystal direction of the silicon substrate to form a trench corresponding with each of the first set of openings; passivating exposed surfaces of at least one of the SiGe layer or the silicon layer in the first set of openings; and at least partially filling each trench with a dielectric.
机译:各种实施例包括场效应晶体管(FET)以及形成这种FET的方法。一种方法包括:在前驱体结构中形成第一组开口,该前驱体结构具有:具有晶体方向的硅基板,该硅基板基本上被第一氧化物邻接;以及覆盖在硅衬底上的硅锗(SiGe)层;覆盖SiGe层的硅层;覆盖在硅层上的第二氧化物;牺牲层,覆盖在第二氧化物上,其中,第一组开口分别暴露出硅衬底;在与硅基板的晶体方向垂直的方向上对硅基板进行底切蚀刻,以形成与第一组开口中的每一个相对应的沟槽;在第一组开口中的SiGe层或硅层中的至少一个的钝化暴露表面;并且至少部分地用电介质填充每个沟槽。

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