首页> 外文期刊>Proceedings of the IEE - Part B: Radio and Electronic Engineering >The authors' replies to the discussion on ????????Measurements of junction-transistor noise in the frequency range 7-50 kc/s????????, ????????A germanium diffused-junction photo-electric cell????????, ????????Transistor power amplifiers????????, ????????Transistor d.c. convertors???????? and ????????Noise in silicon microwave diodes????????
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The authors' replies to the discussion on ????????Measurements of junction-transistor noise in the frequency range 7-50 kc/s????????, ????????A germanium diffused-junction photo-electric cell????????, ????????Transistor power amplifiers????????, ????????Transistor d.c. convertors???????? and ????????Noise in silicon microwave diodes????????

机译:作者对有关在频率范围为7-50 kc / s的结型晶体管噪声的测量的讨论作出了答复。锗扩散结光电电池晶体管功率放大器晶体管直流转换器????????硅微波二极管中的噪声

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