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Semiconductor device having gate electrode with spacers on fin structure and silicide layer filling the recess

机译:半导体器件,其栅电极在鳍片结构上具有间隔物,并且硅化物层填充凹槽

摘要

An semiconductor device is provided. A fin is disposed on a substrate, extending in a lengthwise direction. A first recess is disposed on a sidewall of the fin so that the fin and the first recess is arranged in a straight line along the lengthwise direction. A gate structure crosses the fin in the first direction crossing the lengthwise direction. A spacer is disposed on sidewalk of the gate structure. A source/drain region is disposed in the first recess. The source/drain region is formed under the spacer. A silicide layer is disposed on the source/drain region. The silicide layer and the source/drain region fill the first recess.
机译:提供一种半导体器件。鳍片沿长度方向延伸设置在基板上。第一凹槽设置在鳍片的侧壁上,使得鳍片和第一凹槽沿着长度方向布置在直线上。栅极结构在与长度方向交叉的第一方向上与鳍交叉。间隔物设置在栅极结构的人行道上。源极/漏极区设置在第一凹槽中。源极/漏极区形成在隔离物下方。硅化物层设置在源/漏区上。硅化物层和源/漏区填充第一凹槽。

著录项

  • 公开/公告号US9525036B2

    专利类型

  • 公开/公告日2016-12-20

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号US201514662697

  • 发明设计人 BOMSOO KIM;YONG-MIN CHO;DONG-IL BAE;

    申请日2015-03-19

  • 分类号H01L29/417;H01L29/66;H01L29/78;H01L29/06;H01L29/45;H01L29/08;H01L21/308;

  • 国家 US

  • 入库时间 2022-08-21 13:43:11

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