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Method of improving lifetime of etching liquid and yield in Cu-interconnection process and Cu-interconnection etching device

机译:在铜互连工艺中提高蚀刻液寿命和产率的方法及铜互连蚀刻装置

摘要

The present invention provides a method of improving lifetime of etching liquid and yield in Cu-interconnection process and a Cu-interconnection etching device. The method comprises: step 1, providing an etching spray rising tank (1) and an etching liquid tank (2) connected to the etching spray rising tank (1), and the etching liquid tank (2) contains etching liquid; step 2, employing a first concentration monitoring device (4) to measure a copper ion concentration of the etching liquid in the etching liquid tank (2), and employing a filter (5) to perform copper ion filtering to the etching liquid in the etching liquid tank (2); step 3, employing a second concentration monitoring device (6) to measure a copper ion concentration of the etching liquid after filtering in the step 2, and controlling an amount of the filters (5) employed in the step 2 and reflowing the etching liquid after filtering to the etching liquid tank (2). The present invention can reduce the copper ion concentration of the etching liquid to promote the usage lifetime of the etching liquid and reduce the production cost for raising the stability and yield of the Cu-interconnection production.
机译:本发明提供了一种在Cu互连工艺中改善蚀刻液的寿命和产率的方法以及Cu互连蚀刻装置。该方法包括:步骤 1 ,提供蚀刻液上升槽( 1 )和连接至蚀刻液的蚀刻液槽( 2 )。上升槽( 1 )和蚀刻液槽( 2 )中装有蚀刻液。步骤 2 ,使用第一浓度监视设备( 4 )测量蚀刻液槽( 2 )中蚀刻液的铜离子浓度),并使用过滤器( 5 )对蚀刻液槽( 2 )中的蚀刻液进行铜离子过滤;步骤 3 ,使用第二浓度监测装置( 6 )测量在步骤 2 中过滤后的蚀刻液的铜离子浓度,控制在步骤 2 中使用的过滤器( 5 )的数量,并将过滤后的蚀刻液回流到蚀刻液槽( 2 )。本发明可以降低蚀刻液的铜离子浓度,从而提高蚀刻液的使用寿命,并降低生产成本,以提高Cu互连生产的稳定性和产率。

著录项

  • 公开/公告号US9528188B2

    专利类型

  • 公开/公告日2016-12-27

    原文格式PDF

  • 申请/专利号US201514428980

  • 发明设计人 XUDONG ZHANG;

    申请日2015-02-09

  • 分类号C23F1/14;C23F1/08;C23F1/18;C23F1/34;H01L21/3213;H05K3/00;

  • 国家 US

  • 入库时间 2022-08-21 13:42:39

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