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Integrated circuit device and method of performing self-testing within an integrated circuit device
Integrated circuit device and method of performing self-testing within an integrated circuit device
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机译:集成电路装置和在集成电路装置内执行自检的方法
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摘要
IC device comprising a plurality of functional components arranged into self-test cells. The IC device is configurable into a first self-test configuration comprising a first set of self-test partitions. Each self-test partition within the first set comprising at least one self-test cell. Functional components of the self-test cell(s) of each self-test partition within the first set are arranged to be configured into at least one scan-chain for said self-test partition when the IC device is configured into the first self-test configuration. The IC device is configurable into a second self-test configuration comprising a second set of self-test partitions. Each self-test partition within the second set comprising at least one self-test cell. Functional components of the self-test cell(s) of each self-test partition within the second set are arranged to be configured into at least one scan-chain for said self-test partition when the IC device is configured into the second self-test configuration.
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