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Semiconductor device arrangement, a method of analysing a performance of a functional circuit on a semiconductor device and a device analysis system

机译:半导体器件布置,分析半导体器件上的功能电路的性能的方法和器件分析系统

摘要

A semiconductor device arrangement comprising a functional circuit comprising a plurality of timing components and a reference module comprising a plurality of reference components is described. Each reference component comprises a reference timing component corresponding to a timing component of the plurality of timing components and a controllable timing component. The controllable timing component is arranged to provide a delay in dependence on an applied light stimulus. A method of analyzing a performance of a functional circuit on a semiconductor device is also described. A device analysis system for analyzing a functional circuit comprising a plurality of timing components is also described.
机译:描述了一种半导体器件布置,该半导体器件布置包括:功能电路,其包括多个定时部件;以及参考模块,其包括多个参考部件。每个参考分量包括与多个定时分量中的定时分量相对应的参考定时分量和可控制的定时分量。可控制的定时分量被设置为根据所施加的光刺激来提供延迟。还描述了一种分析半导体器件上的功能电路的性能的方法。还描述了一种用于分析包括多个定时组件的功能电路的设备分析系统。

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