首页> 外国专利> '' Method for probing electrically conductive target material, computer readable medium, computer program product, device for probing electrically conductive target material and mill for processing electrically conductive target material ''

'' Method for probing electrically conductive target material, computer readable medium, computer program product, device for probing electrically conductive target material and mill for processing electrically conductive target material ''

机译:''探测导电靶材的方法,计算机可读介质,计算机程序产品,探测导电靶材的设备和用于加工导电靶材的磨机''

摘要

A method, implemented by a software-controlled computer device and/or by dedicated hardware, for probing an electrically conductive target material, e.g. molten metal or semiconductor material, in a metallurgical vessel. In the method, a measurement signal is acquired from a sensor, which is inserted into the target material, during a relative displacement between the electrically conductive target material and the sensor, the measurement signal being indicative of electrical conductivity in the vicinity of the sensor. The measurement signal is generated to represent momentary changes in an electromagnetic field around the sensor, which is created by operating at least one coil in the sensor. Based on the measurement signal, a signal profile is generated to be indicative of the electrical conductivity as a function of the relative movement. The method enables a probing of the internal distribution of the target material in the vessel at any level of detail.
机译:一种由软件控制的计算机设备和/或专用硬件实施的方法,用于探测导电目标材料,例如金属。冶金容器中的熔融金属或半导体材料。在该方法中,在导电的目标材料和传感器之间的相对位移期间,从插入目标材料中的传感器获取测量信号,该测量信号指示传感器附近的电导率。产生测量信号以表示传感器周围的电磁场的瞬时变化,这是通过操作传感器中的至少一个线圈而产生的。基于测量信号,生成信号曲线以指示作为相对运动的函数的电导率。该方法能够以任何细节水平探测容器中目标材料的内部分布。

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