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The sensor performance and ageing to memories SRAMs and DRAMs.

机译:传感器的性能以及对存储器SRAM和DRAM的老化。

摘要

This invenu00c7u00c3o refers to a sensor for SRAM and DRAM memories that identifies and signals reductions in performance in the operation of reading and writing in the memory cell, for application as a sensor performance and / or aging in digital circuits developed in nanotecno Logias CMOS. This invenu00c7u00c3o is composed of a transiu00c7u00d5es detector and a pulse detector.The detector can generate a pulse transition for each transition existing in a cu00c9lula bit line of memory. The duration of the impulse is directly proportional to the duration of the time transition of bit line.The pulse detector enables you to generate pulses with duration proportional to the time of transition of a signal which toggles on the bit line; the peak detector detects when the duration allows a pulse generated by the transition detector is large enough to indicate the presence of transiu00c7 5 slow occurring in the line of bit, indicating the eminu00cancia errors of reading or writing in the memory.
机译:此发明是指用于SRAM和DRAM存储器的传感器,该传感器可识别并发出在存储单元中进行读写操作时性能下降的信号,并用作传感器性能和/或在开发的数字电路中的老化nanotecno Logias CMOS。该发明由一个transi检测器和一个脉冲检测器组成。该检测器可以为内存中c u00c9lula位线中存在的每个跃迁生成一个脉冲跃迁。脉冲的持续时间与位线的时间跃迁时间成正比。脉冲检测器使您能够生成脉冲,其持续时间与在位线上切换的信号的跃迁时间成正比;峰值检测器检测持续时间何时允许过渡检测器生成的脉冲足够大,以指示在位线中出现慢速传输5的存在,从而指示在存储器中读取或写入的错误。

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