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SILICON CARBIDE MOSFET DEVICE AND PREPARATION METHOD THEREFOR

机译:碳化硅MOSFET器件及其制备方法

摘要

Provided is a silicon carbide MOSFET device, comprising gate oxide layers made up of a first gate oxide layer and a second gate oxide layer, the thickness of the second gate oxide layer being greater than that of the first gate oxide layer. Arranging the gate oxide layers in two portions having different thicknesses so that the gate oxide layers are stepped effectively reduces the electric field strength of the gate oxide layers without affecting the threshold voltage and the gate control characteristics of the device, and the on-resistance of the device may be reduced by increasing the width of a JFET area. Also provided is a manufacturing method for the silicon carbide MOSFET device.
机译:提供一种碳化硅MOSFET器件,其包括由第一栅极氧化物层和第二栅极氧化物层组成的栅极氧化物层,第二栅极氧化物层的厚度大于第一栅极氧化物层的厚度。将栅极氧化物层布置在具有不同厚度的两个部分中,以使栅极氧化物层阶梯状地有效降低栅极氧化物层的电场强度,而不会影响器件的阈值电压和栅极控制特性以及导通电阻。可以通过增加JFET区域的宽度来减小该器件。还提供了一种用于碳化硅MOSFET器件的制造方法。

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