XRF ANALYZER FOR LIGHT ELEMENT DETECTION

摘要

The invention includes an XRF analyzer (10, 20, 30, 50) with reduced x-ray attenuation between sample (39) and target (16) and between sample and detector (13). Attenuation can be reduced by removing atmospheric-air paths through which the x-rays must travel. Reduced x-ray attenuation can allow for easier detection of low-atomic-number elements. Cost saving can be achieved by reducing the number of x-ray windows. The analyzer has a first hermetically-sealed-window-free straight-line path (18) from the detector to the window (12) or aperture (15), and a second hermetically-sealed-window-free straight-line path (19) from the target to the window or aperture.