The invention relates to the field of quantitative determination of the elemental composition of materials by means of X-ray fluorescence analysis (XRF), namely, X-ray fluorescence analyzer for quantification of light elements in the composition of materials. The proposed technical solution may be implemented as a wave (crystal diffraction) spectrometers, and the energy-dispersive analyzer. The technical result - an increase of the analyzer aperture and thereby extend the range analyzed elements to the light elements, which greatly extends the range of research problems solved by using such an analyzer. In addition, the proposed solution makes it possible to simplify the design of the analyzer and to increase its reliability. X-ray fluorescence analyzer light elements comprises a cuvette with a sample and a housing with an opening for the passage of excitation and fluorescence X-ray radiation, having a means for creating and maintaining a predetermined medium, in which are arranged a source of excitation X-radiation and a detector of X-ray fluorescence of the sample radiation, the aperture in the housing wall is provided with a vacuum-tight set holder with a film of the radiolucent window disposed opposite to the sample cuvette. In contrast to the known, in the analyzer is further provided with a window holder rigidly fixed radiotransparent metal grid disposed between the film and the hole formed in the upper wall or cover of the housing, and the holder is fixedly secured to the window. Moreover, in the analyzer plane of support for the cell with the sample can be made as a window film holder.
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