首页>
外国专利>
MANUFACTURING PROCESS ANALYSIS DEVICE, MANUFACTURING PROCESS ANALYSIS METHOD, AND RECORDING MEDIUM WHEREUPON MANUFACTURING PROCESS ANALYSIS PROGRAM IS STORED
MANUFACTURING PROCESS ANALYSIS DEVICE, MANUFACTURING PROCESS ANALYSIS METHOD, AND RECORDING MEDIUM WHEREUPON MANUFACTURING PROCESS ANALYSIS PROGRAM IS STORED
展开▼
机译:制造过程分析装置,制造过程分析方法以及存储制造过程分析程序的介质的记录
展开▼
页面导航
摘要
著录项
相似文献
摘要
The purpose of the present invention is to analyze a problem present in a manufacturing process with higher precision than previously possible, on the basis of data collected in time series which describes a state of the manufacturing process. Provided is a manufacturing process analysis device (30), comprising: a computation unit (31) which computes, in a process in which a manufactured object is manufactured, invariant compliance strengths for each shift time for manufacturing condition values (360) and quality values (361) which are measured in time series; a shift time specification unit (32) which derives, as a specified shift time, a shift time for which the invariant compliance strengths satisfy a baseline; and an analysis unit (33) which analyzes the state of the manufacturing process on the basis of the quality value and the manufacturing condition value for the time which is earlier by the specified shift time than the time at which the quality value is measured.
展开▼