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Manufacturing process analysis apparatus, manufacturing process analysis method, and recording medium storing manufacturing process analysis program

机译:制造过程分析装置,制造过程分析方法和存储制造过程分析程序的记录介质

摘要

Based on the data indicating the state of the manufacturing process collected in time series, problems existing in the manufacturing process are analyzed with higher accuracy. The manufacturing process analysis apparatus (30) has a strong invariant compatibility for each shift time with respect to the manufacturing condition value (360) and the quality value (361) measured in time series in the process of manufacturing a product. A calculation unit (31) for calculating the length, a shift time specifying unit (32) for determining, as a specific shift time, a shift time for which the strength of invariant suitability satisfies a standard, a quality value, and a quality value were measured And an analysis unit (33) for analyzing the state of the manufacturing process based on the manufacturing condition value at a time that is earlier than the specific shift time with respect to the time.
机译:基于按时间顺序收集的表示制造过程状态的数据,可以更高精度地分析制造过程中存在的问题。相对于在产品制造过程中按时间序列测量的制造条件值(360)和质量值(361),制造过程分析装置(30)对于每个转换时间具有很强的不变兼容性。用于计算长度的计算单元(31),用于将恒定适应性的强度满足标准,质量值和质量值的移位时间确定为特定移位时间的移位时间指定单元(32)。然后,测量分析单元(33),该分析单元(33)基于在相对于该时间的特定变速时间之前的时间的制造条件值来分析制造过程的状态。

著录项

  • 公开/公告号JPWO2017022234A1

    专利类型

  • 公开/公告日2018-05-24

    原文格式PDF

  • 申请/专利权人 日本電気株式会社;

    申请/专利号JP20170532379

  • 发明设计人 河合 孝純;落合 勝博;

    申请日2016-08-02

  • 分类号G05B19/418;

  • 国家 JP

  • 入库时间 2022-08-21 13:07:08

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