首页>
外国专利>
METHOD OF CALCULATING CORRECTIONS FOR CONTROLLING A MANUFACTURING PROCESS, METROLOGY APPARATUS, DEVICE MANUFACTURING METHOD AND MODELING METHOD
METHOD OF CALCULATING CORRECTIONS FOR CONTROLLING A MANUFACTURING PROCESS, METROLOGY APPARATUS, DEVICE MANUFACTURING METHOD AND MODELING METHOD
展开▼
机译:用于控制制造过程的校正的计算方法,计量学装置,设备制造方法和建模方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
Corrections (CPE) are calculated for use in controlling a lithographic apparatus (100). Using a metrology apparatus (140) a performance parameter is measured (200) at sampling locations across one or more substrates to which a lithographic process has previously been applied. A process model is fitted (210) to the measured performance parameter, and an up-sampled estimate is provided for process-induced effects across the substrate. Corrections are calculated (230) for use in controlling the lithographic apparatus, using an actuation model and based at least in part on the fitted process model. For locations where measurement data (312) is available, this is added (240) to the estimate to replace the process model values. Thus, calculation of actuation corrections is based on a modified estimate (316) which is a combination of values (318) estimated by the process model and partly on real measurement data (312).
展开▼