首页> 外国专利> EVALUATION METHOD FOR CHARGED PARTICLE BEAM, COMPUTER PROGRAM FOR EVALUATING CHARGED PARTICLE BEAM, AND EVALUATION DEVICE FOR CHARGED PARTICLE BEAM

EVALUATION METHOD FOR CHARGED PARTICLE BEAM, COMPUTER PROGRAM FOR EVALUATING CHARGED PARTICLE BEAM, AND EVALUATION DEVICE FOR CHARGED PARTICLE BEAM

机译:带电粒子束的评估方法,带电粒子束的计算机程序以及带电粒子束的评估装置

摘要

The purpose of the present invention is to provide an evaluation method for a charged particle beam and an evaluation device for a charged particle beam whereby a beam diameter can be expressed from an image, the beam diameter being a major device factor for determining the resolution and image sharpness of an image obtained using a charged particle beam device. To achieve the purpose described above, the present invention provides an evaluation device for a charged particle beam, the evaluation device being provided with an arithmetic unit for evaluating the charged particle beam on the basis of image processing of an image obtained using the charged particle beam device, wherein the arithmetic unit in the proposed method and device performs automatic length measurement of the particle diameter on the image, and calculates the beam diameter of the charged particle beam device on the basis of the particle diameter reference value of an evaluation sample.
机译:发明内容本发明的目的是提供一种带电粒子束的评估方法和一种带电粒子束的评估装置,由此可以从图像表示光束直径,该光束直径是确定分辨率和分辨率的主要设备因素。使用带电粒子束装置获得的图像的图像清晰度。为了实现上述目的,本发明提供了一种用于带电粒子束的评估装置,该评估装置设有用于基于使用带电粒子束获得的图像的图像处理来评估带电粒子束的运算单元。装置,其中所提出的方法和装置中的算术单元对图像上的粒径进行自动长度测量,并基于评估样品的粒径参考值来计算带电粒子束装置的束径。

著录项

  • 公开/公告号WO2017159360A1

    专利类型

  • 公开/公告日2017-09-21

    原文格式PDF

  • 申请/专利权人 HITACHI HIGH-TECHNOLOGIES CORPORATION;

    申请/专利号WO2017JP08047

  • 发明设计人 SASAKI TOMOYO;SATO MITSUGU;

    申请日2017-03-01

  • 分类号H01J37/04;H01J37/22;H01J37/28;H01J37/317;H01L21/66;

  • 国家 WO

  • 入库时间 2022-08-21 13:29:46

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