An object of the present invention is to provide a chip-type electronic component characteristic inspection / classification device having a classification portion for examining electrical characteristics of a chip-type electronic component and classifying the chip-type electronic component based on the inspection result. The sorting portion includes a master 1 in which a plurality of receiving holes for conveying the chip-type electronic component 7 are equally divided on a plurality of concentric circles, and a chip-type electronic component 7 A sorting hole 501 for sorting the chip-type electronic component 7 discharged by the discharge air from the discharge air hole 601; And a sorting bracket 5 provided with a plurality of sets of shooting tubes 503 connected to the sorting holes 501. A flexible tube 502 is provided concentrically on the outer periphery of the tip end of each of the dividing holes 501 so that the distance between the moving surface of the disk 1 on the sorting bracket 5 side and the tip end of the tube 502 is set to be a chip- And a predetermined length smaller than the minimum value of the external dimensions of the component (7).
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