首页> 外国专利> - PRINTING SEMICONDUCTOR ELEMENTS BY SHEAR-ASSISTED ELASTOMERIC STAMP TRANSFER

- PRINTING SEMICONDUCTOR ELEMENTS BY SHEAR-ASSISTED ELASTOMERIC STAMP TRANSFER

机译:-通过剪切辅助弹性图章转移来印刷半导体元件

摘要

A method and apparatus for transfer printing of semiconductor devices on a receiving substrate are provided. In one aspect, the printing is in conformal contact between the elastomeric stamp painted with the ink in the semiconductor element and the receiving substrate, and during stamp removal, a shear offset is applied between the stamp and the receiving substrate. The shear-offset printing process achieves high printing transfer gain with good batch precision. Processing parameter selection during transfer printing, including stamp-backing pressure application and time varying vertical displacement, results in a sufficiently constant delamination rate with subsequent transfer printing improvements.
机译:提供了一种用于在接收基板上转移印刷半导体器件的方法和设备。一方面,印刷是在涂有半导体元件中的墨水的弹性压模与接收基板之间保形接触,并且在压模去除期间,在压模和接收基板之间施加剪切偏移。胶版印刷工艺可实现高印刷转移增益,并具有良好的批处理精度。在转印过程中选择加工参数,包括施加压印背压和随时间变化的垂直位移,会产生足够稳定的分层速度,并改善后续的转印效果。

著录项

  • 公开/公告号KR101736722B1

    专利类型

  • 公开/公告日2017-05-17

    原文格式PDF

  • 申请/专利权人 셈프리어스 아이엔씨.;

    申请/专利号KR20117014025

  • 发明设计人 메날드 에띠앙;

    申请日2009-11-19

  • 分类号H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-21 13:25:33

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