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Analog information based emulation method for investigating reliability of flash memory and apparatus of the same

机译:用于调查闪存可靠性的基于模拟信息的仿真方法及其装置

摘要

The present invention provides an analog information-based emulation method and apparatus for verifying reliability of a flash memory that can quickly verify a physical problem by directly applying a method of storing analog information to an actual flash memory cell in an emulation software (A) writing bit data of 0 or 1 into the flash memory through the emulator, the amount of charge corresponding to bit data of each cell being written; (B) when reading data of the flash memory, (C) comparing the amount of charge inserted into each cell with the range classified as the set threshold voltage, and (c) comparing the amount of charge stored in each cell with the threshold voltage The range of the threshold voltage matched with the amount of charge stored in each cell is detected and discriminated as a corresponding bit And a step of performing the steps of:
机译:本发明提供了一种用于验证闪存可靠性的基于模拟信息的仿真方法和装置,该方法和装置可以通过将模拟信息的存储方法直接应用于仿真软件(A)中的实际闪存单元来快速验证物理问题。通过仿真器将0或1的位数据写入闪存,与每个单元的位数据相对应的电荷量被写入; (B)当读取闪存的数据时,(C)将插入每个单元中的电荷量与分类为设定阈值电压的范围进行比较,以及(c)将每个单元中存储的电荷量与阈值电压进行比较检测并区分阈值电压的范围与每个单元中存储的电荷量,并将其区分为相应的位,并执行以下步骤:

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