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Analog information based emulation method for investigating reliability of flash memory and apparatus of the same
Analog information based emulation method for investigating reliability of flash memory and apparatus of the same
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机译:用于调查闪存可靠性的基于模拟信息的仿真方法及其装置
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摘要
The present invention provides an analog information-based emulation method and apparatus for verifying reliability of a flash memory that can quickly verify a physical problem by directly applying a method of storing analog information to an actual flash memory cell in an emulation software (A) writing bit data of 0 or 1 into the flash memory through the emulator, the amount of charge corresponding to bit data of each cell being written; (B) when reading data of the flash memory, (C) comparing the amount of charge inserted into each cell with the range classified as the set threshold voltage, and (c) comparing the amount of charge stored in each cell with the threshold voltage The range of the threshold voltage matched with the amount of charge stored in each cell is detected and discriminated as a corresponding bit And a step of performing the steps of:
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