METHOD FOR CHARACTERIZING THE POROSITY OF A POROUS MATERIAL BY ANALYZING AN IMAGE OBTAINED BY ELECTRONIC SCAN MICROSCOPY

摘要

The invention relates to a method for characterizing the porosity of a sample of porous material by analyzing at least one image obtained by scanning electron microscopy, said method comprising the following steps: the preparation of a sample of porous material having a polished and electrically conductive face; the acquisition, using a scanning electron microscope, of at least one image of a zone of interest of the polished face of the sample; the capture of the image delivered by the scanning electron microscope and the processing of this image; said method being characterized in that the preparation step comprises the following operations: - providing a sample having a polished face; metallization of said face, so as to obtain a polished metallized face having a higher electrical conductivity than the polished face devoid of metallization; and forming the area of interest by localized polishing carried out in a portion of the metallized face from an accelerated ion beam, for / in order to eliminate the metallization in said portion and to polish the surface thus discovered whereby an area of interest having a lower surface roughness and electrical conductivity than the metallized face is obtained.