首页>
外国专利>
A SYSTEM AND A METHOD FOR RESOLVING A CRYSTAL STRUCTURE OF A CRYSTAL AT ATOMIC RESOLUTION BY COLLECTING X-RAY DIFFRACTION IMAGES
A SYSTEM AND A METHOD FOR RESOLVING A CRYSTAL STRUCTURE OF A CRYSTAL AT ATOMIC RESOLUTION BY COLLECTING X-RAY DIFFRACTION IMAGES
展开▼
机译:通过收集X射线衍射图像在原子分辨率下解决晶体的晶体结构的系统和方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
The present invention discloses a method and a system (2) for resolving a crystal structure of a crystal (4) at atomic resolution by collecting X-ray diffraction images, comprising: a) ejecting a droplet (8) of fluid comprising single or multiple of crystal (4) into an ultrasonic acoustic levitator (6); b) levitating said droplet (8) of fluid comprising said crystal (4) in an ultrasonic acoustic levitator (6); b) monitoring the position and the spinning of the droplet (8) with a visualization apparatus; c) applying X-ray (20) to said crystal (4), said X-ray (20) stemming from an X-ray source (34); and d) detecting the X-ray diffraction images (24) from the said crystal (4) irradiated by the said X-ray source (34) by an X-ray detector (36) being capable to capture two dimensional diffraction patterns.
展开▼