首页> 外国专利> A SYSTEM AND A METHOD FOR RESOLVING A CRYSTAL STRUCTURE OF A CRYSTAL AT ATOMIC RESOLUTION BY COLLECTING X-RAY DIFFRACTION IMAGES

A SYSTEM AND A METHOD FOR RESOLVING A CRYSTAL STRUCTURE OF A CRYSTAL AT ATOMIC RESOLUTION BY COLLECTING X-RAY DIFFRACTION IMAGES

机译:通过收集X射线衍射图像在原子分辨率下解决晶体的晶体结构的系统和方法

摘要

The present invention discloses a method and a system (2) for resolving a crystal structure of a crystal (4) at atomic resolution by collecting X-ray diffraction images, comprising: a) ejecting a droplet (8) of fluid comprising single or multiple of crystal (4) into an ultrasonic acoustic levitator (6); b) levitating said droplet (8) of fluid comprising said crystal (4) in an ultrasonic acoustic levitator (6); b) monitoring the position and the spinning of the droplet (8) with a visualization apparatus; c) applying X-ray (20) to said crystal (4), said X-ray (20) stemming from an X-ray source (34); and d) detecting the X-ray diffraction images (24) from the said crystal (4) irradiated by the said X-ray source (34) by an X-ray detector (36) being capable to capture two dimensional diffraction patterns.
机译:本发明公开了一种通过收集X射线衍射图像以原子分辨率解​​析晶体(4)的晶体结构的方法和系统(2),包括:a)将包含单个或多个晶体(4)的流体的液滴(8)喷射到超声悬浮器(6)中;b)在超声悬浮器(6)中悬浮包含所述晶体(4)的所述液滴(8);b)用可视化装置监测液滴(8)的位置和旋转;c)向所述晶体(4)施加X射线(20),所述X射线(20)源自X射线源(34);和d)利用能够捕获二维衍射图案的X射线检测器(36),检测由被所述X射线源(34)照射的所述晶体(4)的X射线衍射图像(24)。

著录项

  • 公开/公告号EP3380830A1

    专利类型

  • 公开/公告日2018-10-03

    原文格式PDF

  • 申请/专利权人 PAUL SCHERRER INSTITUT;

    申请/专利号EP20160788506

  • 发明设计人 TOMIZAKI TAKASHI;TSUJINO DR. SOICHIRO;

    申请日2016-10-28

  • 分类号G01N23/20;G10K15;

  • 国家 EP

  • 入库时间 2022-08-21 13:16:21

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号