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System and a method for resolving a crystal structure of a crystal at atomic resolution by collecting X-ray diffraction images

机译:通过收集X射线衍射图像以原子分辨率解​​析晶体的晶体结构的系统和方法

摘要

A method and a system for resolving a crystal structure of a crystal at atomic resolution by collecting X-ray diffraction images. The method includes the steps: a) ejecting a droplet of fluid comprising single or multiple of crystal into an ultrasonic acoustic levitator; b) levitating the droplet of fluid with the crystal in the ultrasonic acoustic levitator; b) monitoring the position and the spinning of the droplet with a visualization apparatus; c) applying X-ray to the crystal, the X-ray stemming from an X-ray source; and d) detecting the X-ray diffraction images from the crystal irradiated by the X-ray source by an X-ray detector being capable to capture two dimensional diffraction patterns.
机译:通过收集X射线衍射图像以原子分辨率解​​析晶体的晶体结构的方法和系统。该方法包括以下步骤:a)将包含单个或多个晶体的流体的液滴喷射到超声悬浮器中; b)在超声悬浮器中使带有晶体的流体悬浮。 b)用可视化装置监测液滴的位置和旋转; c)对晶体施加X射线,该X射线源于X射线源; d)通过能够捕获二维衍射图案的X射线检测器,从由X射线源照射的晶体检测X射线衍射图像。

著录项

  • 公开/公告号US10753888B2

    专利类型

  • 公开/公告日2020-08-25

    原文格式PDF

  • 申请/专利权人 PAUL SCHERRER INSTITUT;

    申请/专利号US201615778722

  • 发明设计人 TAKASHI TOMIZAKI;SOICHIRO TSUJINO;

    申请日2016-10-28

  • 分类号G01N23/20025;G10K15;B01L3/02;B01L3/06;G01N23/207;

  • 国家 US

  • 入库时间 2022-08-21 11:30:35

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