首页> 外国专利> REFRACTIVE INDEX MEASUREMENT METHOD, REFRACTIVE INDEX MEASUREMENT DEVICE, AND METHOD OF MANUFACTURING OPTICAL ELEMENT

REFRACTIVE INDEX MEASUREMENT METHOD, REFRACTIVE INDEX MEASUREMENT DEVICE, AND METHOD OF MANUFACTURING OPTICAL ELEMENT

机译:折光指数测量方法,折光指数测量设备以及制造光学元件的方法

摘要

PROBLEM TO BE SOLVED: To measure a refractive index of a detected object with high accuracy.;SOLUTION: Light from a light source 10 is divided into detected light and reference light, the detected light enters a detected object 60, the reference light enters a reference object 50 with known refractive index, and the detected light passing through the detected object 60 and the reference light passing through the reference object 50 interferes with one another, to thereby measure an optical path length difference between the detected light and the reference light. The measured optical path length difference is used to calculate an integer m in indefinite term 2 πm of a phase of the interference light. A refractive index of the detected object 60 is calculated on the basis of the optical path length difference between the detected light and the reference light, refractive index dispersion of the reference object 50, thickness of the detected object 60, and the integer m.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2018,JPO&INPIT
机译:解决的问题:为了高精度地测量被检测物体的折射率;解决方案:来自光源10的光被分成检测光和参考光,检测光进入被检测物60,参考光进入光。具有已知折射率的基准物体50,以及穿过检测物体60的检测光和穿过基准物体50的基准光相互干涉,从而测量检测光与基准光之间的光程差。所测量的光程长度差用于计算干涉光的相位的不确定的2πm的整数m。根据被检测光与基准光的光程差,基准物体50的折射率色散,被检物体60的厚度,以及整数m,算出被检体60的折射率。选图:图1;版权:(C)2018,JPO&INPIT

著录项

  • 公开/公告号JP2018004409A

    专利类型

  • 公开/公告日2018-01-11

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP20160130911

  • 发明设计人 SUGIMOTO TOMOHIRO;

    申请日2016-06-30

  • 分类号G01N21/45;G01M11/02;G01B9/02;G01B11/06;

  • 国家 JP

  • 入库时间 2022-08-21 13:13:58

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