首页>
外国专利>
REFRACTIVE INDEX MEASUREMENT METHOD, REFRACTIVE INDEX MEASUREMENT DEVICE, AND METHOD OF MANUFACTURING OPTICAL ELEMENT
REFRACTIVE INDEX MEASUREMENT METHOD, REFRACTIVE INDEX MEASUREMENT DEVICE, AND METHOD OF MANUFACTURING OPTICAL ELEMENT
展开▼
机译:折光指数测量方法,折光指数测量设备以及制造光学元件的方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
PROBLEM TO BE SOLVED: To measure a refractive index of a detected object with high accuracy.;SOLUTION: Light from a light source 10 is divided into detected light and reference light, the detected light enters a detected object 60, the reference light enters a reference object 50 with known refractive index, and the detected light passing through the detected object 60 and the reference light passing through the reference object 50 interferes with one another, to thereby measure an optical path length difference between the detected light and the reference light. The measured optical path length difference is used to calculate an integer m in indefinite term 2 πm of a phase of the interference light. A refractive index of the detected object 60 is calculated on the basis of the optical path length difference between the detected light and the reference light, refractive index dispersion of the reference object 50, thickness of the detected object 60, and the integer m.;SELECTED DRAWING: Figure 1;COPYRIGHT: (C)2018,JPO&INPIT
展开▼