首页> 外国专利> REFRACTIVE INDEX DISTRIBUTION MEASUREMENT METHOD, REFRACTIVE INDEX DISTRIBUTION MEASUREMENT DEVICE, AND OPTICAL ELEMENT MANUFACTURING METHOD

REFRACTIVE INDEX DISTRIBUTION MEASUREMENT METHOD, REFRACTIVE INDEX DISTRIBUTION MEASUREMENT DEVICE, AND OPTICAL ELEMENT MANUFACTURING METHOD

机译:折射指数分布测量方法,折射指数分布测量装置和光学元件制造方法

摘要

PROBLEM TO BE SOLVED: To measure the refractive index of a lens to be inspected with high accuracy in a nondestructive way.SOLUTION: A lens 60 to be inspected is installed on a reference base 50 having the shape of a form at edges of the lens 60 to be inspected, and the transmission wavefront in a plurality of wavelengths at edges of the lens 60 to be inspected is measured. The refractive index at edges of the lens 60 be inspected is specified on the basis of the transmission wavefront in the plurality of wavelengths at edges of the lens 60 to be inspected and the refractive index of the reference base 50.SELECTED DRAWING: Figure 1
机译:解决的问题:以非破坏性的方式高精度地测量要检查的透镜的折射率。解决方案:将要检查的透镜60安装在基准基座50上,该基准基座50具有在透镜边缘处的形状的形状。待检查透镜60,并在待检查透镜60的边缘处测量多个波长的透射波前。根据要检查的透镜60的边缘处的多个波长中的透射波前和参考基座50的折射率,来指定要检查的透镜60的边缘处的折射率。

著录项

  • 公开/公告号JP2016109593A

    专利类型

  • 公开/公告日2016-06-20

    原文格式PDF

  • 申请/专利权人 CANON INC;

    申请/专利号JP20140248477

  • 发明设计人 SUGIMOTO TOMOHIRO;

    申请日2014-12-08

  • 分类号G01N21/41;G01M11/00;

  • 国家 JP

  • 入库时间 2022-08-21 14:46:19

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