首页> 外国专利> ABRASIVE GRAIN DISPERSION, COMPOSITION KIT FOR POLISHING CONTAINING THE SAME, MANUFACTURING METHOD OF COMPOSITION FOR POLISHING USING THE SAME, COMPOSITION FOR POLISHING, POLISHING METHOD AND MANUFACTURING METHOD OF SUBSTRATE FOR MAGNETIC DISK

ABRASIVE GRAIN DISPERSION, COMPOSITION KIT FOR POLISHING CONTAINING THE SAME, MANUFACTURING METHOD OF COMPOSITION FOR POLISHING USING THE SAME, COMPOSITION FOR POLISHING, POLISHING METHOD AND MANUFACTURING METHOD OF SUBSTRATE FOR MAGNETIC DISK

机译:磨料颗粒分散体,用于包含相同成分的抛光组合套件,使用相同成分进行抛光的组合物的制造方法,用于抛光磁粉的基质的抛光组合物,抛光方法和制造方法

摘要

PROBLEM TO BE SOLVED: To provide a means capable of reducing fine scratch of a polishing object after polishing.;SOLUTION: The invention relates to an abrasive grain dispersion having average primary particle diameter measured by a BET method of 1 nm to 50 nm and a dispersion, and having pH value of 7 to 12, and particle number of the abrasive grain with particle diameter of 0.2 μm or more and less than 0.3 μm measured by number count type particle size distribution counter of 25,000,000 or less per 1 cm3 when the content of the abrasive grain is converted to 30 mass% to total mass of the abrasive grain dispersion.;SELECTED DRAWING: None;COPYRIGHT: (C)2018,JPO&INPIT
机译:解决的问题:提供一种能够减少抛光后的抛光物体的细微划痕的方法。解决方案:本发明涉及一种具有通过BET法测得的平均初级粒径为1nm至50nm的磨料颗粒分散体。分散体,其pH值为7至12,并且通过数计数型粒度分布计数器每1cm测定的25,000,000以下的粒径为0.2μm以上且小于0.3μm的磨粒的颗粒数。 3 当磨料含量占磨料分散体总质量的30%时;选图:无;版权所有:(C)2018,JPO&INPIT

著录项

  • 公开/公告号JP2018039934A

    专利类型

  • 公开/公告日2018-03-15

    原文格式PDF

  • 申请/专利权人 FUJIMI INC;

    申请/专利号JP20160175964

  • 发明设计人 KAMIYA TOMOHIDE;YOKOMICHI NORITAKA;

    申请日2016-09-08

  • 分类号C09K3/14;C09G1/02;G11B5/84;B24B37;

  • 国家 JP

  • 入库时间 2022-08-21 13:13:52

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