首页> 外国专利> IMAGING ELEMENT UNIT, SOLID-STATE IMAGING DEVICE, METHOD FOR MANUFACTURING SOLID-STATE IMAGING DEVICE, AND METHOD FOR SENSING DELAMINATION IN SOLID-STATE IMAGING ELEMENT

IMAGING ELEMENT UNIT, SOLID-STATE IMAGING DEVICE, METHOD FOR MANUFACTURING SOLID-STATE IMAGING DEVICE, AND METHOD FOR SENSING DELAMINATION IN SOLID-STATE IMAGING ELEMENT

机译:成像元件单元,固态成像装置,制造固态成像装置的方法以及用于在固态成像元件中感测分层的方法

摘要

PROBLEM TO BE SOLVED: To increase the manufacturing precision of a solid-state imaging device to increase the reliability of a product.SOLUTION: A sensor unit 13R according to the art hereof comprises: an image sensor 21R; a sensor-attached substrate 22R having the image sensor 21R attached to a substrate surface; and a contact sensor 27 mounted on the substrate surface with the image sensor 21R attached thereto. The contact sensor 27 may be composed of three contact sensors, and they may be mounted around a position where the image sensor 21R is attached.SELECTED DRAWING: Figure 3
机译:解决的问题:为了提高固态成像装置的制造精度以提高产品的可靠性。解决方案:根据本技术的传感器单元13R包括:图像传感器21R;和传感器21R。带传感器的基板22R,其图像传感器21R安装在基板表面上。接触传感器27安装在基板表面上并附有图像传感器21R。接触传感器27可以由三个接触传感器组成,并且它们可以安装在附接图像传感器21R的位置周围。图3:

著录项

  • 公开/公告号JP2018093317A

    专利类型

  • 公开/公告日2018-06-14

    原文格式PDF

  • 申请/专利权人 JAI CORPORATION;

    申请/专利号JP20160233624

  • 发明设计人 MURAKI YOSUKE;

    申请日2016-11-30

  • 分类号H04N5/369;H04N5/232;G03B17/02;

  • 国家 JP

  • 入库时间 2022-08-21 13:13:31

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