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Yield verification method of post layout circuit, yield verification program and yield verification device

机译:后布局电路的良率验证方法,良率验证程序和良率验证装置

摘要

PROBLEM TO BE SOLVED: To achieve the efficiency of the yield verification of a post-layout circuit by performing the necessary number of times of simulation with respect to requested accuracy.SOLUTION: A computer executes a process (step A3) of executing post-layout simulation one time; a process (step S4) of calculating difference data between performance variation data by pre-layout simulation and the post-layout simulation; process (step A5) of calculating yield prediction accuracy by using the difference data; a process (step A6) of determining whether or not the yield prediction accuracy has reached requested accuracy; and a process (step A8) of repeatedly executing the post-layout simulation execution process, the difference data calculation process, the yield prediction accuracy calculation process and the determination process until it is determined that the yield prediction accuracy has reached the requested accuracy, and calculating a yield predictive value when it is determined that the yield prediction accuracy has reached the requested accuracy.
机译:要解决的问题:通过对要求的精度执行必要的仿真次数,以实现布局后电路良率验证的效率。解决方案:计算机执行执行布局后电路的过程(步骤A3)模拟一次;通过布局前模拟和布局后模拟计算性能变化数据之间的差异数据的处理(步骤S4);使用该差异数据计算产量预测精度的处理(步骤A5);确定产量预测精度是否已达到要求精度的过程(步骤A6);重复执行布局后模拟执行处理,差分数据计算处理,成品率预测精度计算处理和确定处理,直到确定成品率预测精度达到要求的精度为止;以及当确定产量预测精度已经达到要求的精度时,计算产量预测值。

著录项

  • 公开/公告号JP6318897B2

    专利类型

  • 公开/公告日2018-05-09

    原文格式PDF

  • 申请/专利权人 富士通株式会社;

    申请/专利号JP20140124387

  • 发明设计人 ▲劉▼ 宇;

    申请日2014-06-17

  • 分类号G06F17/50;

  • 国家 JP

  • 入库时间 2022-08-21 13:07:25

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