首页> 外国专利> APPARATUS AND METHODS FOR MIRROR TUNNEL IMAGING DEVICE AND FOR PROVIDING PSEUDOBESSEL BEAMS IN A MINIATURIZED OPTICAL SYSTEM FOR IMAGING

APPARATUS AND METHODS FOR MIRROR TUNNEL IMAGING DEVICE AND FOR PROVIDING PSEUDOBESSEL BEAMS IN A MINIATURIZED OPTICAL SYSTEM FOR IMAGING

机译:在微型光学成像系统中用于微型隧道成像设备和提供伪光束的装置和方法

摘要

Exemplary apparatus and method are provided for illuminating a sample. With such exemplary apparatus and/or method, it is possible to, using at least one source arrangement, provide at least one first electro-magnetic radiation. Using an optical system of an optics arrangement, it is possible to receive the first electro-magnetic radiation(s), and modifying the at least one first electro-magnetic radiation to be at least one second electro-magnetic radiation so as to be forwarded to the sample. Further, with the optical system, it is possible to extend the at least one second electro-magnetic radiation into or across the sample for a distance of at least 2 times the Raleigh range of a Gaussian beam when the optics arrangement and the sample are stationary with respect to one another. Additionally, using the optical system, it is possible to control a placement of a focus of the at least one second electro-magnetic radiation on or in the sample.
机译:提供了用于照射样品的示例性设备和方法。利用这样的示例性装置和/或方法,可以使用至少一个源布置来提供至少一个第一电磁辐射。使用光学装置的光学系统,可以接收第一电磁辐射,并且将至少一个第一电磁辐射修改为至少一个第二电磁辐射,以便被转发。到样品。此外,利用光学系统,当光学装置和样品静止时,可以将至少一个第二电磁辐射延伸到样品中或穿过样品,其距离至少是高斯光束的罗利范围的2倍。彼此之间。另外,使用光学系统,可以控制样品上或样品中至少一个第二电磁辐射的焦点的位置。

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