首页> 外国专利> TECHNOLOGIES FOR SELECTIVELY ETCHING OXIDE AND NITRIDE MATERIALS AND PRODUCTS FORMED USING THE SAME

TECHNOLOGIES FOR SELECTIVELY ETCHING OXIDE AND NITRIDE MATERIALS AND PRODUCTS FORMED USING THE SAME

机译:选择性蚀刻氧化物和氮化物的技术以及使用该技术制成的产品

摘要

Technologies for selectively etching oxide and nitride materials on a work piece are described. Such technologies include methods for etching a work piece with a remote plasma that is produced by igniting a plasma gas flow. By controlling the flow rate of various components of the plasma gas flow, plasmas exhibiting desired etching characteristics may be obtained. Such plasmas may be used in single or multistep etching operations, such as recess etching operations that may be used in the production of non-planar microelectronic devices.
机译:描述了用于选择性地蚀刻工件上的氧化物和氮化物材料的技术。这些技术包括用远程等离子体蚀刻工件的方法,该远程等离子体通过点燃等离子体气流而产生。通过控制等离子体气体流的各种成分的流速,可以获得表现出期望的蚀刻特性的等离子体。这样的等离子体可以用在单步或多步蚀刻操作中,例如可以在非平面微电子器件的生产中使用的凹槽蚀刻操作。

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