Analysis of the cause of a failure is started within a short period of time after the occurrence ensuring a longer period of time to narrow down the target range of products assumed to contain a failure actualization risk of the same type. When first ID information is received from a semiconductor device with a failure actualized, second ID list information containing a failure actualization risk of the same type based on manufacturing history information is extracted using the first ID as a key, and is broadcast to an automobile. When a failure is detected, third ID information stored in a nonvolatile memory is transmitted to a semiconductor product quality management server. When the second ID list information is received, information related to the failure actualization risk of the same type is output to a driver depending on whether or not the third ID is included in the list information.
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