System and method using OAM spectroscopy leveraging fractional orbital angular momentum as signature to detect materials

摘要

An apparatus detects a material within a sample using signal generation circuitry that generates an orbital angular momentum (OAM) twisted light beam having at least one orbital angular momentum applied thereto. The signal generation circuitry applies the at least one OAM twisted light beam to the sample. The OAM twisted light beam includes at least one fractional OAM state, at least one intensity signature and at least one phase signature unique to the material within the sample. A detector receives the OAM twisted light beam after the OAM twisted light beam passes through the sample and detects the material responsive to a presence of a unique combination of the at least one fractional OAM state, the at least one intensity signature and the at least one phase signature.