首页> 外国专利> Discrimination of low-atomic weight materials using scattering and stopping of cosmic-ray electrons and muons

Discrimination of low-atomic weight materials using scattering and stopping of cosmic-ray electrons and muons

机译:通过散射和阻止宇宙射线电子和μ子来区分低原子量的材料

摘要

Techniques, systems, and devices are disclosed for constructing a scattering and stopping relationship of cosmic-ray charged particles (including cosmic-ray electrons and/or cosmic-ray muons) over a range of low-atomic-mass materials, and to detect and identify content of a volume of interest (VOI) exposed to cosmic-ray charged particles based on the constructed scattering and stopping relationship. In one aspect, a process for constructing a scattering- stopping relationship for a range of low-density materials exposed to cosmic-ray charged particles is disclosed. This technique first determines a scattering parameter and a stopping parameter for each material within the range of low-density materials exposed to charged particles from cosmic ray. The technique then establishes a scattering-stopping relationship of cosmic ray charged particles for the range of low-density materials based on the determined pairs of scattering and stopping parameters associated with the range of low-density materials.
机译:公开了用于构造在一系列低原子质量的材料上的宇宙射线带电粒子(包括宇宙射线电子和/或宇宙射线μ子)的散射和停止关系的技术,系统和装置,并检测和根据所建立的散射和停止关系,确定暴露于宇宙射线带电粒子的目标体积(VOI)的含量。一方面,公开了一种用于为暴露于宇宙射线带电粒子的一系列低密度材料建立散射停止关系的方法。该技术首先确定暴露于宇宙射线带电粒子的低密度材料范围内每种材料的散射参数和停止参数。然后,该技术基于所确定的与低密度材料范围相关的散射和停止参数对,为低密度材料范围建立了宇宙射线带电粒子的散射停止关系。

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