A corresponding test head with vertical contact probes and vertical contact probes, especially for high frequency applications

摘要

A vertical contact probe 21 of a test head for a test device of an electronic device is described which comprises a probe body (not shown) extending longitudinally between each end 24, 25 configured to contact respective contact pads 20C) and the second end is a contact tip (25) configured to contact on a contact pad (26A) of the device under test (26), the body (22) of each vertical contact probe At least one through opening 28 having a length of less than 5000 mu m and extending over its longitudinal dimension. Conveniently the at least one through opening 28 is joined in parallel with each other by a connection center 22c embodied in a filler material 36 in the through opening 28, Is filled with the filling material 36 to define the first and second side portions 22a and 22b and the connection center portion 22c made of the filling material 36 functions as a reinforcing member.