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Feedforward and the control of feedback technique in-situ process

机译:前馈和反馈技术的现场控制

摘要

In polishing substrate in the first pressing plate and before the second time, the first sequence of values obtains the first substrate of first area and the value of the second sequence obtains the substrate and in-situ monitoring system of different second areas. First function, when being suitble to the value obtained before a part of First ray, the second function is suitble to the second time of numerical value obtained before a part of second sequence. Airtight petite person's burnishing parameters are adjusted, and cooperate function based on the first fitting function and second to reduce the region of expected difference. The second substrate, in the first polishing platen using the burnishing parameters calculating adjusted based on the first fitting function and the second installation function.
机译:在第一压板中和第二次抛光之前的基板抛光中,第一序列值获得第一区域的第一基板,第二序列值获得不同的第二区域的基板和原位监测系统。第一函数,当适合于在第一射线的一部分之前获得的值时,第二函数适合在第二次序列的一部分之前获得的数值的第二次。调整气密的小人物的打磨参数,并基于第一拟合函数和第二拟合函数来配合函数以减小预期差异的区域。第二基板,在第一抛光压板中使用根据第一拟合函数和第二安装函数调整的抛光参数计算而得到。

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