首页> 外国专利> Durable metal film deposition to the mask repair

Durable metal film deposition to the mask repair

机译:耐用的金属膜沉积可修复面膜

摘要

A method for repairing a wafer (100), said method comprising the steps of:- Positioning of the wafer (100) in a repair chamber (400), which a repair tool (412) comprises;- Supplying a first gas (404) to the repair chamber (400), wherein the first gas (404) a repair material to repair a defect on the wafer (100) comprises;- Supplying a second gas (408) to the repair chamber (400), wherein the second gas (408) comprises a polar gas and the separation of the repair material, at a defect site on the wafer (100), the defect in the absence of a desired structural material is at the defect;- Activation of the repair tool (412), so that the repair tool (412) with the first gas (404) and the second gas (408) interacts, in order to separate the repair material at the defect, the wafer (100) in order to repair, wherein a dimension of the deposited repair material, less than about 32 nanometers; and- Removal of the repaired in accordance with (100) of the repair chamber (400); wherein the repair material of the first gas (404) a containing chromium material and the second gas is a oxidativgas.
机译:一种用于修理晶片(100)的方法,所述方法包括以下步骤:-将晶片(100)放置在修理工具(412)包括的修理室(400)中;-供应第一气体(404)。到修复室(400),其中第一气体(404)用以修复晶片(100)上的缺陷的修复材料包括:-将第二气体(408)供应到修复室(400),其中第二气体(408)在晶片(100)上的缺陷位置处包含极性气体和修复材料的分离,缺陷处缺少所需的结构材料;-修复工具(412)的激活,使得修复工具(412)与第一气体(404)和第二气体(408)相互作用,以分离缺陷处的修复材料,晶片(100)进行修复,其中尺寸为沉积的修补材料小于约32纳米; -根据修理室(400)的修理(100)移走被修理者;其中第一气体(404)的修复材料包含铬材料,第二气体是氧化性气体。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号