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Method and control device for operating a microspectrometer and microspectrometer system

机译:用于操作显微光谱仪和显微光谱仪系统的方法和控制装置

摘要

The invention relates to a method for operating a microspectrometer (102), the method comprising a step of irradiating a measured object (130) to be measured with a first spectral intensity distribution (120) having a first pulse characteristic (118) and at least one second spectral intensity distribution (124 ) having a second pulse characteristic (122) using a modulatable emitter device (106) of the microspectrometer (102), a step of transmitting one of the first spectral intensity distribution (120) associated first wavelength range (134) and one of the second spectral intensity distribution (124) second wavelength range (136) from a spectral reflectance intensity distribution (132) re-emitted by the measurement object (130) using a tunable filter device (108) of the microspectrometer (102), a step of imaging a radiation intensity of the first wavelength range (134 ) and the second wavelength range (136) in a detector signal (138) using detector means (110) of the microspectrometer (102) and demodulating the detector signal (138) using the first pulse characteristic (118) and the second pulse characteristic (122) a first intensity value (140) associated with the first wavelength range (134) and a second intensity value (142) associated with the second wavelength range (136).
机译:本发明涉及一种用于操作显微光谱仪(102)的方法,该方法包括以下步骤:以具有第一脉冲特性(118)并且至少具有第一脉冲强度的第一光谱强度分布(120)照射待测物体(130)。使用微量光谱仪(102)的可调节发射器装置(106)具有第二脉冲特性(122)的一个第二光谱强度分布(124),传输与第一波长范围相关的第一光谱强度分布(120)中的一个的步骤134)和第二光谱强度分布(124)的第二波长范围(136)中的一个来自由测量对象(130)使用微谱仪的可调滤光装置(108)重新发射的光谱反射强度分布(132) 102),使用显微光谱仪的检测器装置(110)对检测器信号(138)中的第一波长范围(134)和第二波长范围(136)的辐射强度进行成像的步骤(102),并使用第一脉冲特性(118)和第二脉冲特性(122),与第一波长范围(134)关联的第一强度值(140)和第二强度值(142)解调检测器信号(138)与第二波长范围(136)相关联的)。

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