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CAPACITY DETECTION CIRCUIT, SEMICONDUCTOR DEVICE, INPUT DEVICE USING THE SAME, ELECTRONIC APPARATUS, AND CAPACITY DETECTION METHOD
CAPACITY DETECTION CIRCUIT, SEMICONDUCTOR DEVICE, INPUT DEVICE USING THE SAME, ELECTRONIC APPARATUS, AND CAPACITY DETECTION METHOD
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机译:电容检测电路,半导体装置,使用相同的输入装置,电子设备和电容检测方法
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摘要
To provide a capacity detection circuit with which it is possible to solve at least one of conventional problems.SOLUTION: A control signal generator 110 generates a control signal. A drive circuit 120 includes a push-pull type of output stage 122 and applies a drive voltage that corresponds to the control signal generated by the control signal generator 110 to a capacitance Cs. A current detection circuit 130 generates a detection current that is a replica of a current flowing in the output stage 122 of the drive circuit 120. An integration circuit 140 integrates the detection current and generates a detection voltage.SELECTED DRAWING: Figure 3
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