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Method of calculating height of curved surface of microscope slide glass and microscope

机译:显微镜载玻片和显微镜的曲面高度的计算方法

摘要

The invention relates to the field of microscope imaging technology, in particular to calculate the height of a glass slide and estimate the position of the glass slide in a microscope coordinate system by means of height values, under continuous scanning in the case of high magnification magnification. It relates to a method of acquiring a clear image. In the present invention, by using a standard slide glass as a reference point, height values of all standard measurement points on another measurement target slide glass are obtained. The said measurement method is acquired by the conversion relation of a function simultaneous equation of a position coordinate and height value. According to the present invention, the height of the curved surface of any one slide glass can be accurately calculated, and the method of measuring the height of the curved surface can be used for an automatic scanning microscope. This provides a fast and micro scan of the image relative to the sample object on the slide glass. In particular, in the case of high magnification magnification lenses, the advantages of the invention of high imaging definition, high scanning speed, high efficiency and automation are more pronounced.
机译:本发明涉及显微镜成像技术领域,特别是在高放大倍率下连续扫描的情况下,计算载玻片的高度并通过高度值估计载玻片在显微镜坐标系中的位置。 。它涉及一种获取清晰图像的方法。在本发明中,通过使用标准载玻片作为基准点,获得另一测量目标载玻片上所有标准测量点的高度值。所述测定方法通过位置坐标与高度值的函数联立方程的变换关系来获取。根据本发明,可以准确地计算出任何一个载玻片的曲面高度,并且可以将测量曲面高度的方法用于自动扫描显微镜。相对于载玻片上的样本对象,这提供了图像的快速微扫描。特别地,在高倍率放大透镜的情况下,本发明的高成像清晰度,高扫描速度,高效率和自动化的优点更加明显。

著录项

  • 公开/公告号JP2019519000A

    专利类型

  • 公开/公告日2019-07-04

    原文格式PDF

  • 申请/专利权人 イン ユェフォン;

    申请/专利号JP20180564821

  • 发明设计人 イン ユェフォン;

    申请日2016-12-04

  • 分类号G02B21/34;

  • 国家 JP

  • 入库时间 2022-08-21 12:22:26

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