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QUANTITATIVE ANALYSIS METHOD FOR SAMPLE SOLUTIONS USING X-RAY FLUORESCENCE ANALYZER

机译:X射线荧光分析仪用于样品溶液的定量分析方法

摘要

PROBLEM TO BE SOLVED: To provide a method for using an X-ray fluorescence analyzer to highly accurately quantitatively analyze the content of a designated element present in a measured solution in a trace quantity, without requiring a high skill level.SOLUTION: Provided is a quantitative analysis method using an X-ray fluorescence analyzer, comprising the steps of: impregnating a designated quantity of a solution of the measurement target into a medium and then drying it; mounting a jig in a side not facing an X-ray tube for the medium, which jig does not contain the measurement target and internal reference element as its constituent elements, nor emit fluorescent X rays with wavelengths interfering with the detection of fluorescent X rays emitted by the measurement target and the internal reference element, and which thermally and mechanically prevents the medium from deforming by heat radiated from the X ray tube; and mounting the medium and the jig to the X-ray fluorescence analyzer.SELECTED DRAWING: Figure 4
机译:解决的问题:提供一种使用X射线荧光分析仪高度准确地定量分析被测溶液中存在的痕量痕量元素的方法,而无需很高的技术水平。使用X射线荧光分析仪的定量分析方法,包括以下步骤:将指定量的测量目标溶液浸渍到介质中,然后干燥;将夹具安装在不面向介质的X射线管的一侧,该夹具不包含测量目标和内部参考元素作为其构成元素,也不发射具有干扰检测发射的X射线荧光的波长的X射线荧光通过测量目标和内部参考元件,以热和机械方式防止介质因从X射线管辐射的热量而变形。然后将介质和夹具安装到X射线荧光分析仪上。选定的图:图4

著录项

  • 公开/公告号JP6421724B2

    专利类型

  • 公开/公告日2018-11-14

    原文格式PDF

  • 申请/专利权人 住友金属鉱山株式会社;

    申请/专利号JP20150167478

  • 发明设计人 加岳井 敦;

    申请日2015-08-27

  • 分类号G01N23/223;G01N23/2202;G01N23/2204;

  • 国家 JP

  • 入库时间 2022-08-21 12:18:21

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