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Quantitative analysis by energy dispersive X-ray fluorescence by the transmission method applied to geological samples

机译:透射法对地质样品的能量色散X射线荧光定量分析

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Three certified samples of different matrices (Soil-5, SL-1/IAEA and SARM-4/SABS) were quantitatively analysed by energy dispersive X-ray fluorescence with radioisotopic excitation. The observed errors were about 10-20% for the majority of the elements and less than 10% for Fe and Zn in the Soil-5, Mn in SL-1, and Ti, Fe and Zn in SARM-4 samples. Annular radioactive sources of Fe-55 and Cd-109 were utilized for the excitation of elements while a Si(Li) semiconductor detector coupled to a multichannel emulation card inserted in a microcomputer was used for the detection of the characteristic X-rays. The fundamental parameters method was used for the determination of elemental sensitivities and the irradiator or transmission method for the correction of the absorption effect of characteristic X-rays of elements on the range of atomic number 22 to 42 (Ti to Mo) and excitation with Cd-109. For elements in the range of atomic number 13 to 23 (Al to V) the irradiator method cannot be applied since samples are not transparent for the incident and emergent X-rays. In order to perform the absorption correction for this range of atomic number excited with Fe-55 source, another method was developed based on the experimental value of the absorption coefficients, associated with absorption edges of the elements.
机译:通过能量色散X射线荧光和放射性同位素激发,对三种不同基质(土壤5,SL-1 / IAEA和SARM-4 / SABS)的认证样品进行了定量分析。对于土壤5中的大多数元素,观察到的误差约为10-20%,对于土壤5中的Fe和Zn,SL-1中的Mn和SARM-4样品中的Ti,Fe和Zn的误差小于10%。 Fe-55和Cd-109的环形放射源用于元素的激发,而与插入微型计算机中的多通道仿真卡耦合的Si(Li)半导体检测器用于特征X射线的检测。基本参数方法用于确定元素的敏感性,辐照器或透射法用于校正元素特征X射线在原子序数22至42(Ti至Mo)范围内的吸收效应和Cd激发-109。对于原子序数在13到23(A1到V)范围内的元素,由于样品对于入射X射线和出射X射线都不透明,因此无法应用辐照器方法。为了对用Fe-55离子源激发的原子序数范围进行吸收校正,根据吸收系数的实验值开发了与元素吸收边缘相关的另一种方法。

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