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Determining bias configuration for write operations in memory to improve device performance during normal operation as well as to improve the effectiveness of testing routines
Determining bias configuration for write operations in memory to improve device performance during normal operation as well as to improve the effectiveness of testing routines
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机译:确定存储器中写操作的偏置配置,以提高正常操作期间的设备性能以及提高测试例程的有效性
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摘要
Techniques and circuits for testing and configuring bias voltage or bias current for write operations in memory devices are presented. Registers and nonvolatile storage is included on the memory devices for storing values used to control testing of the memory devices as well as for configuring parameters related to both testing and normal operation.
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