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In-situ plasma treatment for thin film resistors

机译:薄膜电阻器的原位等离子体处理

摘要

A method of fabricating integrated circuits (ICs) includes depositing a dielectric liner layer on a substrate including a semiconductor surface having a plurality of IC die formed therein each including functional circuitry including a plurality of interconnected transistors. A thin film resistor (TFR) layer including chromium (Cr) is deposited on the dielectric liner layer. The substrate is loaded into a hardmask layer deposition tool that includes a plasma source. The TFR layer is in-situ plasma pre-treated including flowing at least one inert gas and at least one oxidizing gas while in the hardmask layer deposition tool. A hardmask layer is deposited after the plasma pre-treating while remaining in the hardmask layer deposition tool. A pattern is formed on the hardmask layer, and the hardmask layer and TFR layer are etched stopping in the dielectric liner layer to form at least one resistor from the defined TFR layer.
机译:一种制造集成电路(IC)的方法,包括在包括半导体表面的衬底上沉积介电衬垫层,该半导体表面具有形成在其中的多个IC管芯,每个IC管芯包括具有多个互连晶体管的功能电路。包括铬(Cr)的薄膜电阻器(TFR)层沉积在电介质衬层上。将衬底加载到包括等离子体源的硬掩模层沉积工具中。在硬掩模层沉积工具中,对TFR层进行原位等离子体预处理,包括使至少一种惰性气体和至少一种氧化气体流动。在等离子体预处理之后沉积硬掩模层,同时保留在硬掩模层沉积工具中。在硬掩模层上形成图案,并且蚀刻硬掩模层和TFR层,使其停止在电介质衬里层中,以从限定的TFR层形成至少一个电阻器。

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